IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY《IEEE器件与材料可靠性汇刊》(季刊). The scope of the publication includes, but is not limited to Reliability of: Devices, Materials, Processes, Interfaces, Integrated Microsystems, Transistors, Technology, Integrated Circuits, Thin Film Transistor Applications. The measurement and understanding of the reliability of such entities at each phase, from the concept stage through research and development and into manufacturing scale-up, provides the overall database on the reliability of the devices, materials, processes, package and other necessities for the successful introduction of a product to market.